均匀性校正在颅脑磁化率源分离成像中的应用价值评估

  • 周何凡 ,
  • 李改英 ,
  • 刘俊鹏 ,
  • 钟昊东 ,
  • 李建奇
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  • 1. 华东师范大学 物理学院,上海市磁共振重点实验室,上海 200062;2. 华东师范大学 医学磁共振与分子影像技术研究院,上海 200062 

收稿日期: 2026-03-06

  修回日期: 2026-04-07

  录用日期: 2026-04-23

  网络出版日期: 2026-04-30

基金资助

上海市科学技术委员会资助项目(YDZX20243100003001001); 国家科技创新 2030 资助项目(2021ZD0200500)

Evaluation of Homogeneity Correction in Brain Magnetic Susceptibility Source Separation

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  • 1. Shanghai Key Laboratory of Magnetic Resonance, School of Physics, East China Normal University, Shanghai 200062, China; 2. Institute of Magnetic Resonance and Molecular Imaging in Medicine, East China Normal University, Shanghai 200062, China

Received date: 2026-03-06

  Revised date: 2026-04-07

  Accepted date: 2026-04-23

  Online published: 2026-04-30

摘要

本研究评估了线圈选择及空间均匀性校正对颅脑磁化率源分离成像的影响.基于3 T磁共振成像系统,采用20通道和64通道线圈对10名健康受试者进行扫描,对比空间均匀性校正前后深部灰质核团的磁化率测量值. 结果显示,校正前两线圈在多个核团的定量结果中存在显著差异(P < 0.05);校正后,测量差异消除(P > 0.05),逆磁化率相关系数升至0.87.因此,高通道相控阵线圈的空间不均匀会导致显著磁化率源分离偏差,而均匀性校正可有效消除此类硬件偏差.

本文引用格式

周何凡 , 李改英 , 刘俊鹏 , 钟昊东 , 李建奇 . 均匀性校正在颅脑磁化率源分离成像中的应用价值评估[J]. 波谱学杂志, 0 : 0 . DOI: 10.11938/cjmr2026-3211

Abstract

This study evaluated the impact of radiofrequency coil selection and spatial inhomogeneity correction on susceptibility source separation imaging in the brain. Ten healthy participants were scanned on a 3 T magnetic resonance imaging system using both 20-channel and 64-channel coils. Susceptibility measurements of deep gray matter nuclei were compared before and after spatial inhomogeneity correction. Prior to correction, significant differences were observed across multiple deep gray matter nuclei between the two coils (P < 0.05). After correction, these differences were no longer significant (P > 0.05), and the correlation coefficient for diamagnetic susceptibility increased to 0.87. These findings demonstrate that spatial inhomogeneity associated with high-channel-count phased-array coils can introduce substantial bias in susceptibility source separation, whereas inhomogeneity correction effectively mitigates such hardware-related bias.

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