Chinese Journal of Magnetic Resonance ›› 1992, Vol. 9 ›› Issue (4): 361-367.

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ESR STUDIES OF ELECTRON BEAM EVAPORATED a-Si1-xNdx FILMS

Gan Runjing, Zhang Jinyan, Chen Guanghua   

  1. Dept. of Physics, Lanzhou University, Lanzhou 730000
  • Received:1991-06-07 Revised:1991-10-30 Published:1992-12-05 Online:2018-01-20

Abstract: The variation of ESR parameters, such as g factor, line-shape factor (l), peak to peak linewidth (ΔBpp) and spin density (Ns), with the composition (x) for electron beam evaporated a-Si1-xNdx films was studied. Based on the optical absorption and conductive properties in this kind of alloy films, using the dangling bond model with Nd back bonds, the variation of properties are analyzed and discussed.

Key words: Rare earth element, Alloy film, Dangling bond, ESR